IO-Link Tooling

The IO-Link Interface Specification V1.1.3 defines a specific Test Device (see Appendix H.2.2 Test of a Master) that shall be connected to an IO-Link Master during the execution of EMC tests.

The device generates an 8-bit random number which is read out by the master. During the test the master shall return this random number to the device in the next IO-Link cycle.

The device checks whether it receives the correct random number and increments an internal error counter if not. The error counter is also incremented if a checksum error or a parity error is detected on the Device side.

The error count can be read out by the Master via an IO-Link parameter after the test. In addition, the error counter value is displayed by a 7-segment indicator.

When an error is detected, the Device generates a trigger signal to an optical output. A trigger box that converts the optical signal into a trigger pulse can be connected to the device. The trigger pulse supports developers in identifying possible issues on the Master side.

The Device can be configured to operate in one of 3 COM-speeds by DIP-Switches or by IO-Link Parameters.

• Device fully compliant to V1.1.3 IO-Link Interface Specification
• All 3 COM-Speeds supported (via Switch Selector and IO-Link Parameter)
• Internal Pseudo-Random-Number Generators
• Error counter for Parity, Checksum, Data and Time-out Errors
• 7-Segment Error Counter Display
• 7-Segment Device Status Display
• Error Counter accessible via IO-Link
• Optical Error Trigger Output
• Additional support of round-trip delay measurements
  
• Total error counts and maximum error counts within standardized group of M-Sequences separately available via IO-Link. Two group sizes selectable per COM-Speed
  

• Better time-to-market
  
• Identification of EMC issues

The IO-Link Diagnosis Tool analyzes the IO-Link signal both electrically and logically. It is an essential tool for engineers and users of IO-Link technology to identify any kind of issues in the IO-Link connection.

The Diagnosis Tool is based on a high-speed multi-channel A/D converter that measures voltages and currents on both the C/Q and the L+ line. The measured data are transferred via USB to a software running on a Windows PC.

The IO-Link communication can be analyzed seamlessly on byte-level, on M-sequence level, on protocol level and even on application level. In the latter case, the IO-Link communication is visible in clear text. Folding, filtering and search functions simplify issue identification.

It is also possible to visualize sections as waveforms, and even eye-diagrams for Master and Device signals can be extracted.

Typically, the Diagnosis Tool is inserted between Master and Device. However, an integrated Master allows checking of Devices without an external Master. The tracked communication is shown and recorded directly on a PC.

• Timing accurate IO-Link signal analysis
• High speed, IO-Link synchronized ADC
• Timing precise software UART decoding
• Optional hardware signal direction detection
• Byte-, frame-, protocol- or IODD-based decoding
• Sophisticated filtering and search features
• Device image collection of all data sent
• Data storage image collection
• Recording of IO-Link byte stream to PC/SD-card
• Analog signal view for UL+, IL+, UCQ, ICQ
• Serial decoding in analogue waveform view
• Eye diagram view separated for Device/Master
• Interactive rulers for analogue measurements
• new: Trigger-Out connector in V2.0
  
• User calibration support
• Integrated master
  

• Fast and easy IO-Link issue analysis
• Logical and electrical issue detection
• Suitable for development and application

IO-Link devices need to be described by IO-Link Device Descriptions called "IODD". These IODD are complex structured XML files with numerous restrictions and interdependencies. Editing an IODD can become a laborious and tedious task and it is difficult to maintain integrity between device and IODD in case of modifications.

TEConcept has developed an IODD Studio that simplifies the editing of IODDs significantly.

The IODD Studio is a flexible tool which lets the user create the desired IODD and only gives feedback about errors found by the custom validators. For this reason, this tool is recommended for users with experience working with IODD files. The IODD Studio supports creation of new IODDs from scratch as well as import and modification of existing IODDs. The user can also customize the validation rules that are enforced on the created IODD.

Created / modified IODDs can be checked and "stamped" by using the "official" IODD checker from the IO-Link webpage.

• Complies to IO-Link Interface Specification V1.1.3
• Wireless IODD Support
• Configurable IODD Validators
• Current project status can be saved and restored
• Integrated IODD Finder
• IOLFW Package Creator
• Integrated XML Viewer / Editor
• BLOB Transfer Profile Support
• Identification & Diagnosis Profile Support
• Import elements from existing IODDs
• Installer for Windows 7/8/10

• Speed up of IODD editing
• XML know how not required
• Import and modification of IODDs supported
• Flexibility
• Configurable input validation
• Vendor specific IODD Template creation

TEConcept has developed a Physical Layer Tester “PLT” for Devices to run Physical Layer Tests according to the IO-Link Test Specification. The Physical Layer Tester is powered by an external 48V power supply; it is controlled via a USB port and offers a standard M12 connector for the Devices Under Test "DUT". A PC software tool asks for the IODD of the DUT and automatically adjusts most of its test procedure parameters according to the capabilities of the DUT. The test cases are defined by XML files that are accessible by the user.

The PLT is based on a high-speed multi-channel A/D converter that measures voltages and currents on both the C/Q and the L+ line. For every test case, a specific snapshot of signals is taken and stored. In order to generate these signals, the PLT includes all necessary elements, such as an IO-Link Master, adjustable voltage and current sources, line simulations and so forth.

These snapshots are visualized in an oscilloscope-like view by the PC application. They must be analyzed in a semiautomatic way where measurements are taken by moving graphical cursors that are linked with voltage current and time values. The measured data are entered / copied into predefined fields and used for an automatically generated test report.

• Compliant to IO-Link Test Specification V1.1.3
  
• User calibration support
  
•  IODD support
  
• Integrated IO-Link Master
  
• Integrated Line Simulation
  
• Semiautomatic measurement procedure based on recorded waveforms
  
• SIO – Mode tests
  
• BIT – and UART Eye-Diagrams
• Test Report Generation (PDF)
  

• All test results are stored in a reloadable test data file

• All components to run Physical Layer Tests are included
  
• Substantial reduction of test effort and test duration
• Automatic test report generation

• IO-Link Physical Layer Tester
  
• 48V Power Supply, USB cable
  
• Connector cables
• Windows-based graphical user interface