IO-Link EMC Test Device

For the test, the test device generates 8-bit random numbers, which are read as process data by the master and should be written back to the test device in the next cycle. The device then checks whether the process data returned by the master matches the data sent in the previous cycle and increments an internal error counter if this is not the case. The error counter is also incremented if a checksum error or a parity error is detected, or if a master cycle is completely missing. The status of the error counter is shown on a seven-segment display. Additionally, the master can read the error counter via IO-Link parameters after the test is completed. The IO-Link interface also allows the error levels of the individual error types to be read.








The EMC test device is configurable. For example, the baud rate can be set via DIP switches.