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IO-Link EMC Test Device – EMC Conformance Testing for IO-Link Masters

The IO-Link Interface Specification requires a specific test device for the EMC test (see Annex H.2.2: Test of a Master), which is to be connected to the master when performing the EMC test. The IO-Link EMC Test Device meets these requirements and tests your IO-Link master against the required specifications.

Would you like to test your IO-Link master for EMC compliance?

The EMC Test Device provides you with reliable error statistics for the EMC compliance test of your master.

Product Datasheet

Functional Description

For the test, the test device generates 8-bit random numbers, which are read as process data by the master and should be written back to the test device in the next cycle. The device then checks whether the process data returned by the master matches the data sent in the previous cycle and increments an internal error counter if this is not the case. The error counter is also incremented if a checksum error or a parity error is detected, or if a master cycle is completely missing. The status of the error counter is shown on a seven-segment display. Additionally, the master can read the error counter via IO-Link parameters after the test is completed. The IO-Link interface also allows the error levels of the individual error types to be read.

The EMC test device is configurable. For example, the baud rate can be set via DIP switches.

EMC Test-Device Features

Complies with the requirements of the V1.1.X IO-Link Interface Specification
All 3 COM rates are supported (DIP switches and IO-Link parameters)
Internal pseudo-random number generator
Error counters for parity, checksum, data, and timeout errors
Dual 7-segment display for operating mode and error status
Error levels are accessible via IO-Link
Additional support for round-trip delay measurements
Total error count and maximum error count within a standardized group of M-sequences available separately via IO-Link. Two group sizes selectable per COM speed

Additional test systems for your IO-Link Master project

In addition to the protocol test, the Physical Layer test and the EMC test are also required for full IO-Link certification (Test & Quality IO Link Community). To achieve this goal with minimal effort, TEConcept offers additional diagnostic & test tools that can be used directly by members of the IO-Link Community to issue the required certifications. For non-members, TEConcept, as an accredited IO-Link Competence and Test Center, handles the execution of the certification tests.

Contact

If you have any questions about the test device for EMC compliance testing or its functions, please use our contact form. Our team will be happy to assist you.