IO-Link EMC Test Master
The IO-Link specification defines procedures for testing the EMC robustness of IO-Link devices, which can be verified using TEConcept’s IO-Link EMC Test Master. Among other things, it examines the sensitivity of IO-Link communication of IO-Link devices under EMC conditions. This requires a robust master that is far less sensitive to EMC noise than the device under test. This is achieved by splitting the IO-Link Master into two parts: Part 1 contains the sensitive digital logic (µC box), and Part 2 contains the IO-Link transceiver (PHY box). Both parts are separated by an optical connection of up to 10 m in length.
Would you like a reliable test of the EMC interference immunity of your IO-Link device?
IO-Link EMC Test Master Specifications
- Complies with IO-Link Interface Specification V1.1.2 and the current IO-Link Test Specification.
- Error and signal output
- 4 electrical IO-Link port configurations
COM1 / 2 port (good signal)
COM1 / 2 port (bad signal)
COM3 port (good signal)
COM3 port (bad signal) - RS232 and USB interfaces
- Terminal-based control command set
- Additional EMC test and control software with graphical user interface
- Test report generation in PDF format
- Can be configured for operation as a standard “USB IO-Link Master“
- Firmware update supported
Advantages the IO-Link EMC Test Master offers you
- Sensitive parts are located outside the EMC chamber
- EMC robustness significantly better than required
Additional test systems for your IO-Link device project
In addition to the emc test, the protocol test and physical layer test are also required for full IO-Link certification (Test & Quality IO-Link Community). To achieve this goal with as little effort as possible, TEConcept offers additional diagnostic & test tools that members of the IO-Link Community can use directly to obtain the required certifications. For non-members, TEConcept, as an accredited IO-Link Competence and Test Center, carries out the certification tests.
IO-Link Device Tester
Automatically tests the protocol compliance of IO-Link devices according to the IO-Link test specification. With IODD-based configuration and detailed test reports — approved by the IO-Link Community for standard-compliant conformance testing.
IO-Link Physical Layer Tester
Tests the electrical interface of IO-Link devices: signal level, bit timing, and current consumption according to the IO-Link specification. Automatically generates a report — a prerequisite for IO-Link certification.
IO-Link Diagnosis Tool
Enables parameterization, process data evaluation, and device diagnostics for IO-Link devices directly on the PC — ideal for commissioning, field use, and technical support.
Contact
- +49 761 21443640
- +49 761 21443636
- info@teconcept.de